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Characterization of si-GaAs wafer quality by room-temperature photoluminescence

✍ Scribed by M. Baumgartner; K. Löhnert


Book ID
103615742
Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
482 KB
Volume
50
Category
Article
ISSN
0169-4332

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Rapid dislocation-related D1-photolumine
✍ Schmid, R. P. ;Mankovics, D. ;Arguirov, T. ;Ratzke, M. ;Mchedlidze, T. ;Kittler, 📂 Article 📅 2011 🏛 John Wiley and Sons 🌐 English ⚖ 334 KB

## Abstract Here we report on a novel method, which allows rapid photoluminescence imaging of band‐to‐band and dislocation‐related radiation, D1, on multicrystalline silicon wafers at room temperature. We demonstrate spatially resolved 5.0 × 5.0 cm^2^ D1‐images, with a resolution of ∼120 µm, within