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Dislocation-related photoluminescence imaging of mc-Si wafers at room temperature

✍ Scribed by D. Mankovics; R. P. Schmid; T. Arguirov; M. Kittler


Book ID
115554854
Publisher
John Wiley and Sons
Year
2012
Tongue
English
Weight
289 KB
Volume
47
Category
Article
ISSN
0232-1300

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πŸ“œ SIMILAR VOLUMES


Rapid dislocation-related D1-photolumine
✍ Schmid, R. P. ;Mankovics, D. ;Arguirov, T. ;Ratzke, M. ;Mchedlidze, T. ;Kittler, πŸ“‚ Article πŸ“… 2011 πŸ› John Wiley and Sons 🌐 English βš– 334 KB

## Abstract Here we report on a novel method, which allows rapid photoluminescence imaging of band‐to‐band and dislocation‐related radiation, D1, on multicrystalline silicon wafers at room temperature. We demonstrate spatially resolved 5.0 × 5.0 cm^2^ D1‐images, with a resolution of ∼120 ¡m, within