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Characterization of reactive ion etching-induced damage to n-GaN surfaces using schottky diodes

โœ Scribed by A. T. Ping; A. C. Schmitz; I. Adesida; M. Asif Khan; Q. Chen; J. W. Yang


Book ID
107457535
Publisher
Springer US
Year
1997
Tongue
English
Weight
549 KB
Volume
26
Category
Article
ISSN
0361-5235

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