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Characterization of p-n junctions and surface-states on silicon devices by photoemission electron microscopy

✍ Scribed by M. Giesen; R.J. Phaneuf; E.D. Williams; T.L. Einstein; H. Ibach

Publisher: Springer
Year: 1997
Tongue: English
Weight: 335 KB
Volume: 64
Category: Article
ISSN: 1432-0630
DOI: 10.1007/s003390050500

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