Thermally stimulated current measurements on silicon junctions produced by implantation of low energy boron ions : J. C. Muller, R. Stuck, R. Berger and P. Siffert. Solid State Electron. 1974. Vol. 17 p. 1293

• Publisher: Elsevier Science
• Year: 1975
• Tongue: English
• Weight: 99 KB
• Volume: 14
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(75)90697-6