Thermally stimulated current measurements on silicon junctions produced by implantation of low energy boron ions

✍ Scribed by J.C. Muller; R. Stuck; R. Berger; P. Siffert

• Publisher: Elsevier Science
• Year: 1974
• Tongue: English
• Weight: 362 KB
• Volume: 17
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(74)90007-0