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Characterization of methylated amorphous silicon by IR and Raman spectroscopies

✍ Scribed by Pham V. Huong; J. Derouault; I. Solomon; H. Tranquoc


Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
276 KB
Volume
9
Category
Article
ISSN
0921-5107

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