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Characterization of MBE grown Si/GexSi1−x strained layer superlattices

✍ Scribed by D.C. Houghton; D.J. Lockwood; M.W.C. Dharma-Wardana; E.W. Fenton; J.-M. Baribeau; M.W. Denhoff

No coin nor oath required. For personal study only.

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