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Characterization of Langmuir-Blodgett overlayers by time-of-flight secondary ion mass spectrometry

✍ Scribed by Birgit Hagenhoff; Alfred Benninghoven; Hans-Ulrich Siegmund; Dieter Holtkamp

Book ID: 113205179
Publisher: Elsevier Science
Year: 1992
Tongue: English
Weight: 354 KB
Volume: 210-211
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(92)90352-c

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