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Characterization of high-quality MBE-grown GaN films on intermediate-temperature buffer layers

✍ Scribed by C.F. Zhu; W.K. Fong; B.H. Leung; C. Surya

Publisher: Springer
Year: 2001
Tongue: English
Weight: 157 KB
Volume: 72
Category: Article
ISSN: 1432-0630
DOI: 10.1007/s003390100797

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