Characterization of Ge/Si0.16Ge0.84 multiple quantum wells on Ge-on-Si virtual substrate using piezoreflectance spectroscopy

✍ Scribed by Wu, P.H.; Huang, Y.S.; Hsu, H.P.; Li, C.; Huang, S.H.; Tiong, K.K.

• Book ID: 120449492
• Publisher: Elsevier Science
• Year: 2013
• Tongue: English
• Weight: 961 KB
• Volume: 167
• Category: Article
• ISSN: 0038-1098
• DOI: 10.1016/j.ssc.2013.04.035