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Electrical characterization studies of p-type Ge, Ge1−ySny, and Si0.09Ge0.882Sn0.028 grown on n-Si substrates

✍ Scribed by Harris, Thomas R.; Ryu, Mee-Yi; Yeo, Yung Kee; Beeler, Richard T.; Kouvetakis, John

Book ID: 122365326
Publisher: Elsevier Science
Year: 2014
Tongue: English
Weight: 649 KB
Volume: 14
Category: Article
ISSN: 1567-1739
DOI: 10.1016/j.cap.2013.11.009

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