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Characterization of electron cyclotron resonance process plasma and film deposition

โœ Scribed by Shoji Miyake; Wei Chen


Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
558 KB
Volume
139
Category
Article
ISSN
0921-5093

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The paper presents the investigation of the effect of the process parameters on the structure of hydrogenated amorphous carbon (a-C:H) films deposited on Si(100) substrate by electron cyclotron resonance microwave plasma chemical vapor deposition method (ECR-PCVD). The investigation is based on an o