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Characterization of electromigration parameters in VLSI metallizations by 1/ƒ noise measurements

✍ Scribed by Zeynep Çelik-Butler; Wiyi Yang; Hoang H. Hoang; William R. Hunter


Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
253 KB
Volume
34
Category
Article
ISSN
0038-1101

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