Characterization of electromigration parameters in VLSI metallizations by 1/ƒ noise measurements

✍ Scribed by Zeynep Çelik-Butler; Wiyi Yang; Hoang H. Hoang; William R. Hunter

• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 253 KB
• Volume: 34
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(91)90087-f