Prediction of electromigration failure in W/Al-Cu multilayered metallizations by 1/f noise measurements: Zeynep Celik-Butler and Min Ye. Solid-State Electronics35(9), 1209 (1992)

• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 115 KB
• Volume: 33
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(93)90152-o