Prediction of electromigration failure in W/Al-Cu multilayered metallizations by 1f noise measurements

✍ Scribed by Zeynep Çelik-Butler; Min Ye

• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 337 KB
• Volume: 35
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(92)90150-b