Characterization of electromigration parameters in VLSI metallizations by 1tf noise measurements: Zeynep Celik-Butler, Wiyi Yang, Hoang H. Hoang and William R. Hunter, Solid-St. Electron.34(2), 185 (1991)

• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 128 KB
• Volume: 31
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(91)90150-6