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Characterization of deep defects in CdS/CdTe thin film solar cells using deep level transient spectroscopy

โœ Scribed by J. Versluys; P. Clauws; P. Nollet; S. Degrave; M. Burgelman

Book ID
113936500
Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
229 KB
Volume
451-452
Category
Article
ISSN
0040-6090

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โœ N. Christoforou; J.D. Leslie; S. Damaskinos ๐Ÿ“‚ Article ๐Ÿ“… 1989 ๐Ÿ› Elsevier Science โš– 906 KB

This paper reports on the first successful measurements of deep levels in CuInSe2 by deep level transient spectroscopy (DLTS) on 9% efficient CdS/CuInSe2 solar cells. The results indicate the presence in the p-type CuInSe2 films with a carrier concentration of 1 X 10 is cm -3 of a hole trap of conce