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Characterization and properties of Zn–O–Se ternary system thin films deposited by radio-frequency (rf)-magnetron sputtering

✍ Scribed by H.L. Pan; B. Yao; M. Ding; R. Deng; T. Yang; Y.R. Sui; T.T. Zhao; L.L. Gao

No coin nor oath required. For personal study only.

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