Capacitance-voltage (C V) characteristics and temperature dependence of current density-voltage (J-V) characteristics of as-grown amorphous gallium arsenide (a-GaAs) thin film heterojunctions formed on n-type crystalline silicon (c-Si(n)) have been measured. It has been found that the depletion laye
Characteristics of heterojunctions of amorphous LaAlO2.73 on Si
β Scribed by Yanhong Huang; Kun Zhao; Huibin Lu; Kui-juan Jin; Meng He; Zhenghao Chen; Yueliang Zhou; Guozhen Yang
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 186 KB
- Volume
- 373
- Category
- Article
- ISSN
- 0921-4526
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β¦ Synopsis
High-quality heterojunctions consisting of n-type amorphous LaAlO 3Γd and p-type Si without Si interfacial layer were prepared using a thin film deposition system normally used for laser-molecular beam epitaxy. Good I-V rectifying property, ferroelectricity of interface enhancement and fast photovoltaic effect have been observed in the LaAlO 3Γd /Si p-n heterojunctions. We expect that the multifunctional properties of rectification, ferroelectricity and photovoltaic effect should open up new possibilities in device development and other applications.
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