✦ LIBER ✦

Channel width dependence of mechanical stress effects induced by shallow trench isolation on device performance of nanoscale nMOSFETs

✍ Scribed by Seonhaeng Lee; Dongwoo Kim; Cheolgyu Kim; Chiho Lee; Jeongsoo Park; Bongkoo Kang

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Shallow-Trench-Isolation (STI)-Induced M

✍ Su, V.C.; Kuo, J.B.; Lin, I.S.; Guan-Shyan Lin; Chen, D.C.; Chune-Sin Yeh; Cheng 📂 Article 📅 2008 🏛 IEEE 🌐 English ⚖ 717 KB

Influence of dummy active patterns on me

✍ Dongwoo Kim; Seonhaeng Lee; T.K. Oh; S.Y. Cha; S.J. Hong; Bongkoo Kang 📂 Article 📅 2011 🏛 Elsevier Science 🌐 English ⚖ 281 KB

Measurement of mechanical stresses induc

✍ Seonhaeng Lee; Dongwoo Kim; Cheolgyu Kim; T.K. Oh; S.Y. Cha; S.J. Hong; Bongkoo 📂 Article 📅 2012 🏛 Elsevier Science 🌐 English ⚖ 684 KB