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Change in the structure of sputtered SnO2 films during annealing

✍ Scribed by L. Król-Stȩpniewska; G. Beensh-Marchwicka; A. Misiuk

Publisher
Elsevier Science
Year
1984
Tongue
English
Weight
59 KB
Volume
116
Category
Article
ISSN
0040-6090

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The microstructural defects of nanocrystalline SnO 2 thin films prepared by pulsed laser deposition have been investigated using transmission electron microscopy, high-resolution transmission electron microscopy and Raman spectroscopy. Defects inside nanocrystalline SnO 2 thin films could be signifi