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Cd1−xZnxTe thin films formed by non-aqueous electrochemical route

✍ Scribed by N.B. Chaure; Shweta Chaure; R.K. Pandey

Book ID
108119288
Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
881 KB
Volume
54
Category
Article
ISSN
0013-4686

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Optical Constants of Polycrystalline Cd1
Optical Constants of Polycrystalline Cd1−xZnxTe Thin Films by Spectroscopic Ellipsometry
✍ K. Prasada Rao; O. Md. Hussain; B. Srinivasulu Naidu; P. Jayarama Reddy 📂 Article 📅 1997 🏛 John Wiley and Sons 🌐 English ⚖ 127 KB 👁 2 views

Spectroscopic ellipsometry has been used to determine the optical constants-complex dielectric constant (e\* = e 1 + e 2 ), refractive index (n), extinction coefficient (k), absorption coefficient (a) and normal incidence reflectivity (R)-of two-source vacuum-evaporated polycrystalline Cd 1 Àx Zn x