Spectroscopic ellipsometry has been used to determine the optical constants-complex dielectric constant (e\* = e 1 + e 2 ), refractive index (n), extinction coefficient (k), absorption coefficient (a) and normal incidence reflectivity (R)-of two-source vacuum-evaporated polycrystalline Cd 1 Àx Zn x
✦ LIBER ✦
Polycrystalline Cd1−xZnxTe thin films on glass by pulsed laser deposition
✍ Scribed by A. Aydinli; A. Compaan; G. Contreras-Puente; Alice Mason
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 417 KB
- Volume
- 80
- Category
- Article
- ISSN
- 0038-1098
No coin nor oath required. For personal study only.
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