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Carrier density fluctuation noise in silicon junction field effect transistors at low temperatures

✍ Scribed by M.J. Churchill; P.O. Lauritzen

Publisher: Elsevier Science
Year: 1971
Tongue: English
Weight: 575 KB
Volume: 14
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(71)90167-5

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