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Carbon nitride thin films deposited by the reactive ion beam sputtering technique

โœ Scribed by Satoshi Kobayashi; Shinji Nozaki; Hiroshi Morisaki; Shigeo Fukui; Susumu Masaki


Book ID
113205338
Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
423 KB
Volume
281-282
Category
Article
ISSN
0040-6090

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Aluminium nitride thin films deposited b
โœ V. Dimitrova; D. Manova; T. Paskova; Tz. Uzunov; N. Ivanov; D. Dechev ๐Ÿ“‚ Article ๐Ÿ“… 1998 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 375 KB

AlN-films prepared by dc reactive magnetron sputtering. AlN in an Ar+N 2 gas mixture have been prepared and their microstructure, hardness, refractive index and IR transmittance examined. At l = 640 nm the refractive index was 1.93 and k = 3ร—10 -3 ; high transmission occurred between [??] structure