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Capacitor-Coupled Built-Off Self-Test in Analog and Mixed-Signal Embedded Systems

✍ Scribed by Byoungho Kim, ; Abraham, J. A.

Book ID: 127209393
Publisher: Institute of Electrical and Electronics Engineers
Year: 2013
Tongue: English
Weight: 747 KB
Volume: 60
Category: Article
ISSN: 1549-7747
DOI: 10.1109/tcsii.2013.2251953

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