Testing Analog and Mixed-Signal Circuits With Built-In Hardware—A New Approach

✍ Scribed by Das, S. R.; Zakizadeh, J.; Biswas, S.; Assaf, M. H.; Nayak, A. R.; Petriu, E. M.; Jone, W. B.; Sahinoglu, M.

• Book ID: 114630515
• Publisher: IEEE
• Year: 2007
• Tongue: English
• Weight: 614 KB
• Volume: 56
• Category: Article
• ISSN: 0018-9456
• DOI: 10.1109/tim.2007.894223