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Capacitance voltage measurements on n-type InAs MOS diodes

✍ Scribed by R.J. Schwartz; R.C. Dockerty; H.W. Thompson Jr.

Publisher: Elsevier Science
Year: 1971
Tongue: English
Weight: 744 KB
Volume: 14
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(71)90086-4

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