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Capacitance voltage measurements on N-type InAs MOS diodes: R. J. Schwartz, R. C. Dockerty and H. W. Thompson, Jr., Solid-St. Electron.14 (1971), p. 115


Publisher
Elsevier Science
Year
1971
Tongue
English
Weight
105 KB
Volume
10
Category
Article
ISSN
0026-2714

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