✦ LIBER ✦

Capacitance-Voltage Characterization of LPCVD-Silicon Oxynitride Films

✍ Scribed by Szekeres, A. ;Alexandrova, S. ;Modreanu, M.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Characterization of PECVD deposited sili

✍ SP Speakman; PM Read; A Kiermasz 📂 Article 📅 1988 🏛 Elsevier Science 🌐 English ⚖ 543 KB

Plasma-enhanced deposition of silicon ox

✍ J.E. Schoenholtz; D.W. Hess 📂 Article 📅 1987 🏛 Elsevier Science 🌐 English ⚖ 380 KB

Ellipsometric characterization of hydrog

✍ A. Borghesi; A. Sassella; S. Rojas 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 314 KB

Band diagram and conductivity of silicon

✍ V.A. Gritsenko; N.D. Dikovskaja; K.P. Mogilnikov 📂 Article 📅 1978 🏛 Elsevier Science 🌐 English ⚖ 260 KB

Correlation of refractive index and sili

✍ W.R. Knolle 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 592 KB

Controlled index of refraction silicon o

✍ Yi-Ming Xiong; Paul G. Snyder; John A. Woollam; G.A. Al-Jumaily; F.J. Gagliardi; 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 451 KB