𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Built-in current testing

✍ Scribed by Maly, W.; Patyra, M.

Book ID
119773518
Publisher
IEEE
Year
1992
Tongue
English
Weight
412 KB
Volume
27
Category
Article
ISSN
0018-9200

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Design of ICs applying built-in current
Design of ICs applying built-in current testing
✍ Wojciech Maly; Marek Patyra πŸ“‚ Article πŸ“… 1992 πŸ› Springer US 🌐 English βš– 828 KB

Built-in Current (BIC) sensors have proven to be very useful in testing static CMOS ICs. In a number of experimental ICs BIC sensors were able to detect small abnormal Ioo Q currents. This paper discusses the design of the circuit under test and Built-in Current (BIC) sensors, which provide: maximu

Design of testing circuit and test gener
Design of testing circuit and test generation for built-in current testing
✍ Yukiya Miura; Yasushi Wada; Kozo Kinoshita πŸ“‚ Article πŸ“… 1993 πŸ› John Wiley and Sons 🌐 English βš– 736 KB

## Abstract Recently current testing is beginning to be noticed as a testing method for CMOS circuits. However, since CMOS circuits cause the dynamic current due to switching, it has been pointed out that testing at a fast clock rate by current testing is difficult. To cope with this problem a buil

Built-in current testing for CMOS logic
Built-in current testing for CMOS logic circuits using random patterns
✍ Hiroshi Yokoyama; Hideo Tamamoto; Yuichi Narita πŸ“‚ Article πŸ“… 1994 πŸ› John Wiley and Sons 🌐 English βš– 829 KB

## Abstract With respect to CMOS logic circuits, it is reported that a fault can occur cannot be covered by conventional classical fault model, and the current testing is considered to be interesting as a testing method to detect such a fault. This paper proposes a fault‐detection method for the C