GaN thin films have been grown on Si(001) substrate with specially designed composite intermediate layers (CIL) consisting of an ultrathin amorphous silicon layer and a GaN/Al x Ga 1± ±x N multilayered buffer by low pressure metal-organic chemical vapor deposition (MOCVD). The improved film quality
Buffer free MOCVD growth of GaN on 4H-SiC: Effect of substrate treatments and UV-photoirradiation
✍ Scribed by Losurdo, Maria ;Giangregorio, Maria M. ;Bruno, Giovanni ;Kim, Tong-Ho ;Choi, Soojeong ;Brown, April
- Book ID
- 105363608
- Publisher
- John Wiley and Sons
- Year
- 2006
- Tongue
- English
- Weight
- 684 KB
- Volume
- 203
- Category
- Article
- ISSN
- 0031-8965
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✦ Synopsis
Abstract
GaN has been grown directly on the Si‐face 4H‐SiC(0001) substrates using remote plasma‐assisted metalorganic chemical vapour deposition (RP‐MOCVD) with UV‐light irradiation. The effects of substrate pre‐treatments and UV‐photoirradiation of the growth surface on GaN nucleation and film morphology are investigated. Optical data from spectroscopic ellipsometry measurements and morphological data show an improvement in nucleation and material quality with UV‐light irradiation. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
📜 SIMILAR VOLUMES
## Abstract In order to obtain a high quality thick GaN layer on a 2‐inch Si substrate without any crack, we investigated three kinds of buffer layer (AlGaN graded structure, AlN/GaN super lattice (SL) structure, and AlN/thick GaN/AlN structure) using a metal‐organic chemical vapor deposition (MOCV