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Bias Annealing of Radiation and Bias Induced Positive Charges in N- and P-Type MOS Capacitors

✍ Scribed by Suzuki, Kazumichi; Sakagami, Masaharu; Nishimura, Eiichi; Watanabe, Kikuo

Book ID: 114663163
Publisher: IEEE
Year: 1985
Tongue: English
Weight: 711 KB
Volume: 32
Category: Article
ISSN: 0018-9499
DOI: 10.1109/tns.1985.4334042

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