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Modeling the field and thermal dependence of radiation-induced charge annealing in MOS devices

โœ Scribed by Emelianov, V.V.; Sogoyan, A.V.; Meshurov, O.V.; Ulimov, V.N.; Pershenkov, V.S.


Book ID
121349376
Publisher
IEEE
Year
1996
Tongue
English
Weight
787 KB
Volume
43
Category
Article
ISSN
0018-9499

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