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Bending manipulation and measurements of fracture strength of silicon and oxidized silicon nanowires by atomic force microscopy

✍ Scribed by Stan, Gheorghe; Krylyuk, Sergiy; Davydov, Albert V.; Cook, Robert F.

Book ID
119957190
Publisher
Cambridge University Press
Year
2011
Tongue
English
Weight
514 KB
Volume
27
Category
Article
ISSN
0884-2914

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