Incorporation of active Fe impurities in
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T. Cesca; A. Gasparotto; A. Verna; B. Fraboni; G. Impellizzeri; F. Priolo; L. Ta
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Article
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2006
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Elsevier Science
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English
⚖ 148 KB
Single GaInP layers, grown by MOVPE lattice matched to GaAs, were implanted with Fe at T = 200 °C and annealed at 450 or 600 °C. The role of implantation temperature and fluence in determining the crystal damage, and the damage recovery by annealing are investigated by RBS-channeling measurements. T