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Band offsets of epitaxial LaAlO3/TiO2interface determined by X-ray photoelectron spectroscopy

✍ Scribed by J. Y. Yang; Y. Sun; P. Lv; L. He; R. F. Dou; C. M. Xiong; J. C. Nie

Publisher: Springer
Year: 2011
Tongue: English
Weight: 393 KB
Volume: 105
Category: Article
ISSN: 1432-0630
DOI: 10.1007/s00339-011-6535-5

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