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Band alignment and interfacial properties of atomic layer deposited (TiO2)x(Al2O3)1−xgate dielectrics on Ge

✍ Scribed by Xue-Fei Li; Ying-Ying Fu; Xiao-Jie Liu; Ai-Dong Li; Hui Li; Di Wu


Book ID
106022711
Publisher
Springer
Year
2011
Tongue
English
Weight
900 KB
Volume
105
Category
Article
ISSN
1432-0630

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