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Band Alignment and Band Gap Characterization of La 2 O 3 Films on Si Substrates Grown by Radio Frequency Magnetron Sputtering

✍ Scribed by Liu, Qi-Ya; Fang, Ze-Bo; Ji, Ting; Liu, Shi-Yan; Tan, Yong-Sheng; Chen, Jia-Jun; Zhu, Yan-Yan

Book ID: 125485884
Publisher: Institute of Physics
Year: 2014
Tongue: English
Weight: 589 KB
Volume: 31
Category: Article
ISSN: 0256-307X
DOI: 10.1088/0256-307X/31/2/027702

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