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Ballistic electron microscopy study of ultrathin oxidized aluminum barriers for magnetic tunnel junctions

✍ Scribed by Rippard, W. H.; Perrella, A. C.; Buhrman, R. A.

Book ID: 120072470
Publisher: American Institute of Physics
Year: 2001
Tongue: English
Weight: 531 KB
Volume: 78
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.1352045

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