✦ LIBER ✦

Magnetization reversal of patterned spinâtunnel junction material: A transmission electron microscopy study

✍ Scribed by Ardhuin, H.; Chapman, J. N.; Aitchison, P. R.; Gillies, M. F.; Kirk, K. J.; Wilkinson, C. D. W.

Book ID: 120024892
Publisher: American Institute of Physics
Year: 2000
Tongue: English
Weight: 801 KB
Volume: 88
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.1287410

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Transmission Electron Microscopy Study o

Transmission Electron Microscopy Study of Thermally Annealed Low Resistance Magnetic Tunnel Junction

✍ Kyung, H. ;Lee, J.H. ;Yoon, C.S. ;Kim, C.K. 📂 Article 📅 2002 🏛 John Wiley and Sons 🌐 English ⚖ 296 KB 👁 1 views

Low-resistance magnetic tunneling junctions consisting of Ta/NiFe/Cu/NiFe/IrMn/CoFe/Al (6.6 and 7.7 A)-oxide/CoFe/NiFe/Ta were fabricated with the plasma-oxidized insulation layer. Electrical properties and microstructure of the junctions are characterized before and after annealing the junction at

Microstructural properties and dislocati

Microstructural properties and dislocation evolution on a GaN grown on patterned sapphire substrate: A transmission electron microscopy study

✍ Kim, Y. H.; Ruh, H.; Noh, Y. K.; Kim, M. D.; Oh, J. E. 📂 Article 📅 2010 🏛 American Institute of Physics 🌐 English ⚖ 623 KB

Magnetization reversal of patterned spinâtunnel junction material: A transmission electron microscopy study

Magnetization reversal of patterned spinâtunnel junction material: A transmission electron microscopy study