Tunneling current and thickness inhomogeneities of ultrathin aluminum oxide films in magnetic tunneling junctions

✍ Scribed by Luo, E. Z.; Wong, S. K.; Pakhomov, A. B.; Xu, J. B.; Wilson, I. H.; Wong, C. Y.

• Book ID: 126107399
• Publisher: American Institute of Physics
• Year: 2001
• Tongue: English
• Weight: 496 KB
• Volume: 90
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.1412586