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Ballistic-electron-emission microscopy of subsurface defects at the Au-GaAs(100) interface

✍ Scribed by M.H. Hecht; L.D. Bell; W.J. Kaiser

Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 834 KB
Volume: 41-42
Category: Article
ISSN: 0169-4332
DOI: 10.1016/0169-4332(89)90027-5

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