Electron Microscopy of Nanoledges at the (001)InAs/(001)GaAs Interface for an Approximate Orientation Relationship

✍ Scribed by Youssef, S. Ben ;Fnaiech, M. ;Chen, F. R. ;Loubradou, M. ;Bonnet, R.

• Publisher: John Wiley and Sons
• Year: 1999
• Tongue: English
• Weight: 425 KB
• Volume: 174
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/(sici)1521-396x(199908)174:2<403::aid-pssa403>3.0.co;2-2