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Automated magnification calibration in transmission electron microscopy using Fourier analysis of replica images

โœ Scribed by Jeroen A.W.M. van der Laak; Henry B.P.M. Dijkman; Martin M.M. Pahlplatz

Book ID
108291659
Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
307 KB
Volume
106
Category
Article
ISSN
0304-3991

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