✦ LIBER ✦
Transmission electron microscopy analysis of extended defects in multicrystalline silicon using in-situ EBIC/FIB sample preparation
✍ Scribed by Falkenberg, M. A.; Seibt, M.
- Book ID
- 118766666
- Publisher
- John Wiley and Sons
- Year
- 2012
- Tongue
- English
- Weight
- 227 KB
- Volume
- 10
- Category
- Article
- ISSN
- 1862-6351
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