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Imaging of interfaces in semiconductor materials using high resolution transmission electron microscopy

✍ Scribed by Fernando A. Ponce

Publisher: Elsevier Science
Year: 1982
Tongue: English
Weight: 786 KB
Volume: 9
Category: Article
ISSN: 0304-3991
DOI: 10.1016/0304-3991(82)90202-9

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