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Auger electron spectroscopy analysis at the ultrasonically welded interface between alumina and aluminum

✍ Scribed by Takehiko Watanabe; Atsushi Yanagisawa; Shiro Sunaga


Book ID
107440328
Publisher
The Minerals, Metals & Materials Society
Year
2003
Tongue
English
Weight
650 KB
Volume
34
Category
Article
ISSN
1073-5623

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Surface analysis at the sidewalls of VLS
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## Abstract Spatially defined excitation by a confined primary electron beam is the basis of conventional scanning Auger microscopy. This method encounters a physical limitation in spatial resolution when it is used for the analysis of sidewall surface of micron‐ and submicron‐sized patterns on VLS