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Measurement of the interlayer between aluminum and silicon dioxide using ellipsometric, capacitance-voltage and auger electron spectroscopy techniques

✍ Scribed by G.A. Candela; K.F. Galloway; Y.M. Liu; J. Fine


Book ID
107863982
Publisher
Elsevier Science
Year
1981
Tongue
English
Weight
605 KB
Volume
82
Category
Article
ISSN
0040-6090

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